Risk Level Prediction of Fine Chemical Hazard based on Improved Wavelet Transform

Can Liu

School of Electronic Engineering, Xi’an Shiyou University, Xi’an, 710065, China

Abstract: Due to the complexity of the risk level prediction index of fine chemical hazard, its prediction results are easily affected by subjective factors, and the improved wavelet transform technology can effectively reduce the event impact threshold, so the risk level prediction of fine chemical hazard based on the improved wavelet transform is proposed. According to the hazard identification standard, the hazard risk level index was established, and the risk level prediction threshold was modified by combining with the improved wavelet transform technology, so as to complete the hazard level prediction after denoising. The simulation experiment is designed, and the prediction results of the improved wavelet transform prediction method and the conventional neural network model prediction method are compared, which proves the effectiveness of the design.

Keywords: Improvement; Wavelet transform; Fine chemical industry; Risk level